ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,061, issued on Sept. 1, was assigned to TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. (Hsinchu, Taiwan). "GaN reliability built-in self t... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,062, issued on Sept. 1, was assigned to Advanced Micro Devices Inc. (Santa Clara, Calif.). "Laser perturbation probing" was invented by Rav... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,063, issued on Sept. 1, was assigned to Rohde & Schwarz GmbH & Co. KG (Munich). "Test and/or measurement system" was invented by Julian Har... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,064, issued on Sept. 1, was assigned to XINGR TECHNOLOGIES (ZHEJIANG) Ltd. (Yiwu City, China). "Wafer test cassette, wafer test system and ... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,065, issued on Sept. 1, was assigned to Synopsys Inc. (Sunnyvale, Calif.). "Manufacturing automatic test equipment and field ambient compar... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,066, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Test apparatus with test chamber for burn in... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,067, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Semiconductor test apparatus and power suppl... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,068, issued on Sept. 1, was assigned to SAMSUNG ELECTRONICS Co. Ltd. (Suwon-si, South Korea). "Training method and test apparatus using the... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,069, issued on Sept. 1, was assigned to Bonsai Systems Inc. (Vancouver, Canada). "Sensor circuit and method" was invented by Jurgen Hissen ... Read More
ALEXANDRIA, Va., Sept. 1 -- United States Patent no. 12,724,070, issued on Sept. 1, was assigned to Amazon Technologies Inc. (Reno, Nev.). "Seamless universal verification methodology" was invented b... Read More